Items where Author is "Tsew, Tee Kim"
 | Up a level |
Group by: Item Type | No Grouping
Number of items: 1.
Radiographic sensitivity in industrial radiographic testing with x-ray films. In: Malaysia International NDT Conference and Exhibition, 22/11/2015 - 24/11/2015, Sunway Putra Hotel, Kuala Lumpur, Malaysia. (2015)